Jung Suk Hahm

  • Associate at Amster, Rothstein & Ebenstein, LLP (32 Attorneys)
  • New York, NY 10016-1387
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Areas of Practice (2)

  • Patent Prosecution
  • Patent Litigation

Education & Credentials

University Attended:
Cornell University, A.B. in physics, 1989; University of Illinois, Urbana-Champaign, M.S. in physics, 1991
Law School Attended:
Cornell Law School, J.D., 2000
Year of First Admission:
registered to practice before the U.S. Patent and Trademark Office; 2001, New York, U.S. Court of Appeals, Federal Circuit, and U.S. District Court, Southern and Eastern Districts of New York; 2000, New Jersey and U.S. District Court, District of New Jersey

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