Ann Whei Chen

AC
  • Shanghai, China 200040
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Education & Credentials

University Attended:
California Institute of Technology, B.S., 1997
Law School Attended:
Vanderbilt University, J.D., 2001
Year of First admission:
2002
Admission:
2002, New York; registered to practice before U.S. Patent and Trademark Office
ISLN:
916004437

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