Amanda Kay Streff

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Education & Credentials

University Attended:
Vanderbilt University, B.E., 2008; Vanderbilt University, B.E., 2008
Law School Attended:
Washington and Lee University School of Law, J.D.; Washington and Lee University School of Law, J.D.
Year of First Admission:
2011
Admission:
2011, Illinois; US Court of Appeals for the Federal Circuit; US District Court for the Eastern District of Texas; US District Court for the Northern District of Illinois; registered to practice before U.S. Patent and Trademark Office
ISLN:
922029265

Areas of Practice (7)

  • Intellectual Property
  • Copyright Litigation
  • Counseling & Prosecution
  • ITC Section 337 Actions
  • Patent Litigation
  • Trademark Litigation
  • Trial Proceedings Before the PTAB

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Amanda Kay Streff: Associate at Mayer Brown LLP