David Lewis Heath

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Education & Credentials

University Attended:
Bucknell University, B.S., 1977; New York University, M.S., 1982; New York University, Ph.D., 1985
Law School Attended:
Benjamin N. Cardozo School of Law, Yeshiva University, J.D., 1999
Year of First Admission:
2000
Admission:
2000, New York; registered to practice before U.S. Patent and Trademark Office
ISLN:
914402891

Areas of Practice (3)

  • Patent Prosecution
  • Patent Application
  • Patent Litigation

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David Lewis Heath: Associate at F. Chau & Associates, LLC