Jonathan Wayne Hallman

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Education & Credentials

University Attended:
Illinois State University, B.S., 1983; University of Illinois at Chicago, 1988
Law School Attended:
University of California at Los Angeles School of Law, J.D., 1996
Year of First Admission:
1996
Admission:
1996, California; registered to practice before U.S. Patent and Trademark Office
ISLN:
910308685

Areas of Practice (6)

  • Intellectual Property
  • Patent Prosecution
  • Intellectual Property Litigation
  • International Trade Commission Section 337 Proceedings
  • Patent Reexaminations
  • Patent Application

Peer Reviews

5.0/5.0 (5 reviews)
Peer Reviewed

  • Legal Knowledge

    5.0/5.0

  • Analytical Capability

    5.0/5.0

  • Judgment

    5.0/5.0

  • Communication

    5.0/5.0

  • Legal Experience

    5.0/5.0

  • 5.0/5.0 Rated by a Partner on 11/29/09 in Patent Applications

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  • 5.0/5.0 Rated by a Partner on 11/27/09 in Intellectual Property

    Jon has a very good grasp of the intellectual property laws, legal issues and solutions needed to advise clients in an effective and competent manner. Jon is a great patent lawyer and is an asset to the legal profession.

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  • 5.0/5.0 Rated by a Partner on 11/27/09 in Patent Applications

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  • 5.0/5.0 Rated by a Partner on 11/27/09 in Patent Prosecution

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  • 5.0/5.0 Rated by a Partner on 11/26/09 in Patent Applications

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Peer reviews submitted prior to 2008 are not displayed.

Client Reviews Write a Review

Location

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Jonathan Wayne Hallman: Partner at Haynes and Boone, LLP

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