Ms. Lisa Beyer Sims

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Education & Credentials

University Attended:
Georgia Institute of Technology, B.S., 2001; Georgia Institute of Technology, B.S., 2001
Law School Attended:
Emory University, J.D., 2004
Year of First Admission:
2004
Admission:
2004, Georgia; registered to practice before the U.S. Patent and Trademark Office
ISLN:
917994799

Areas of Practice (1)

  • Intellectual Property

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