Raymond E Farrell

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Education & Credentials

University Attended:
Manhattan College, B.M.E., 1985
Law School Attended:
St. John's University, J.D., 1989
Year of First Admission:
1989
Admission:
1989, Connecticut; 1990, New York; 1992, U.S. Court of Appeals for the Federal Circuit; 1993, U.S. District Court, Eastern District of New York; 1993, U.S. District Court, Southern District of New York; registered to practice before U.S. Patent and Trademark Office
ISLN:
901380980

Areas of Practice (16)

  • Patent Application
  • Patent Infringement
  • Criminal Defense
  • Copyright Application
  • Criminal Defense
  • Copyright Application
  • Strategic Patent
  • Trademark Portfolio Development and Management
  • Product Pipeline Development Strategies and Implementation
  • Patentability Investigations
  • Application Preparation and Prosecution
  • Due Diligence Investigations
  • Clearance Investigations (Freedom-To-Operate/Right-To-Use) and Associated Opinions
  • Technology and Science
  • Mechanical and Electromechanical Devices
  • Computer Software and Business Methods

Peer Reviews

5.0/5.0
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Location

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Raymond E Farrell: Member at Carter DeLuca Farrell & Schmidt, LLP
  • Melville, NY
    445 Broadhollow Rd., Ste. 420
    Melville, NY 11747-3685


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