Terryence F. Chapman

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Education & Credentials

University Attended:
Wayne State University, 1974
Law School Attended:
Wayne State University, J.D., 1982
Year of First Admission:
1982
Admission:
1982, Michigan; registered to practice before U.S. Patent and Trademark Office
ISLN:
908437267

Areas of Practice (4)

  • Patents
  • Trademarks
  • Copyrights
  • Intellectual Property Law

Peer Reviews

4.4/5.0 (1 review)
Martindale-Hubbell® Distinguished Rating Badge
  • Legal Knowledge

    4.4/5.0
  • Analytical Capability

    4.4/5.0
  • Judgment

    4.4/5.0
  • Communication

    4.4/5.0
  • Legal Experience

    4.4/5.0
Peer reviews submitted prior to 2008 are not displayed.

Client Reviews Write a Review

Location

Terryence F. Chapman: Member at Flynn, Thiel, Boutell & Tanis, P.C.