Vincent Kendall Shier

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Education & Credentials

University Attended:
Pennsylvania State University, Ph.D.; University of Rochester, B.A.
Law School Attended:
George Washington University Law School, J.D.
Year of First Admission:
2005
Admission:
2005, Virginia; U.S. District Court for the Eastern District of Virginia; Registered to practice before the U.S. Patent and Trademark Office
ISLN:
916847560

Areas of Practice (6)

  • Utility Patent Procurement & Prosecution
  • PTAB Proceedings
  • Chemicals
  • Life Sciences
  • Defective and Dangerous Products
  • Litigation

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Vincent Kendall Shier: Partner at Oblon, McClelland, Maier & Neustadt, L.L.P.