Patrick Joseph Fay

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Education & Credentials

University Attended:
Rensselaer Polytechnic Institute, B.E., 1987
Law School Attended:
University of Notre Dame, J.D., 1990
Year of First Admission:
1991
Admission:
1991, New York; U.S. Court of Appeals, Federal Circuit; U.S. District Court, Southern District of New York; U.S. District Court, Eastern District of New York; registered to practice before the U.S. Patent and Trademark Office
ISLN:
907497842

Areas of Practice (3)

  • Intellectual Property
  • Licensing
  • Litigation

Peer Reviews

2.9/5.0 (3 reviews)
Martindale-Hubbell® Notable Rating Badge
  • Legal Knowledge

    2.9/5.0
  • Analytical Capability

    2.9/5.0
  • Judgment

    2.8/5.0
  • Communication

    3.0/5.0
  • Legal Experience

    3.0/5.0
Peer reviews submitted prior to 2008 are not displayed.

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Patrick Joseph Fay: Partner at Fay Kaplun & Marcin, LLP